They feature high ppb level detection ability, broad digit analysis concentration ranges, and batch analysis of multiple elements. Recent wider usage has resulted in an increased demand for shorter analysis times and improved high-matrix sample detection. As a result, we have developed two models - a "multitype" using a semiconductor detector to shorten analysis times, and a high-resolution sequential type for improved detection. The Assistant Function automatically carries out wavelength selection for measured elements and interference correction for coexisting elements, tasks that typically relied on the skill of the analyst. Simple and accurate measurement is possible even with hard-to-measure high-matrix samples. Features High Throughput A large-scale 1-inch CCD detector with a large number of elements has been adopted, together with an Echelle spectrometer, providing high-speed measurement.
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This, in turn, allows accurate calculation of the extent of interference with analysis data from coexistent elements. The ICPE is equipped with qualitative database calibration functionality based on a mixed sample of multiple elements. Perform all-element calibration simply and quickly. Information on interference amount for all interference elements All-element batch calibration Accurate evaluation of interference amounts from coexisting elements All elements calibrated simply and quickly Simple selection of analysis elements Automatic selection of optimal analysis wavelengths Method Development Assistant Automatic Wavelength Selection System After simply choosing elements for analysis from the qualitative results, the Method Development Assistant automatically selects the optimal wavelength from the interference element database.
When necessary, correction information is automatically created by the Assistant, which means that the same high-level measurement conditions created by experienced analysts through trial and error can now be easily reproduced. The ICPE automatic wavelength selection system completely automates the troublesome task of wavelength selection.
After measurement, the optimal wavelength is selected for the measurement sample from all of the wavelengths registered, and the measurement results are then displayed. Further, the optimal wavelength is selected for each measurement sample, ensuring reliable results, even with unanticipated spectral interference.
Automated setting of measurement conditions Fully automatic analysis wavelength selection Simple creation - simply select the analysis elements Automatic selection of the optimal wavelength for each measurement sample Can also handle spectral interference Automated sample investigation after measurement Method Diagnosis Assistant In many multitype ICP spectrometers, measurement may be possible even without a pre-measurement evaluation of the analysis sample, but evaluation after measurement is extremely difficult.
Depending on the sample, if a time-consuming evaluation is not carried out, accurate results may not be obtainable. The ICPE offers a key advandage over other spectrometers with its Method Diagnosis Assistant, which automates the troublesome work of evaluation, corrects incomplete methods, and determines accurate values through recalculation.
Measurements that would take five minutes or more with a sequential-type device are now completed in only a few minutes. In addition, evaluation and recalculation is simple, as all-element and all-wavelength data is acquired during measurement.
If the Assistant is used,the evaluation is completed quickly and automatically. A vacuum spectrometer does not require high-purity gas for internal gas purging. This reduces running costs since no gas other than the Argon used in the measurement is required.
Performance quality is maintained even during long-term measurements Extremely Stable Vacuum Spectrometer Spectrometer stability is extremely important for stable measurement over extended periods. In addition, since the vacuum spectrometer always maintains a vacuum, contamination does not occur. Even during long-term use, there is basically no reduction in sensitivity due to contamination.
This ensures the ICPE is always stable, and measurements are always assured. In multitype devices, semiconductor detectors with a large number of elements are indispensable for increasing resolution. However, with small-sized detectors, pixel size is reduced, which, in turn, reduces the amount of light captured by each pixel.
In addition, in comparison with conventional semiconductor detectors, the ICPE runs at a relatively high cooling temperature degrees Celsius , which shortens the initial stabilization period and provides long-term stability. For this reason, options are used to reduce the quantity of sample introduced. Often, torch layout direction is the primary cause of contamination and blockages.
With a radial-axis torch layout, gravity causes the sample to gradually fall while it moves through the torch, leading to adhesion to the walls, contamination and torch blockage. With the ICPE, a vertical torch orientation is used in order to solve these problems. As a result, even with high-matrix samples, contamination and torch blockages are minimized, ensuring stable measurement.
Vertical Orientation Sample adhesion to walls is minimized, providing trouble-free measurement, even with high-matrix samples. Radial Orientation Conventional device Alignment in the radial direction means the sample falls, adhering to the tube in the torch, resulting in contamination and blockages. Even if element selection is incorrect, recalculation without remeasurement is simple, due to the storage of all elemental data. Equipped with qualitative database calibration Sample Measurement is Simple Using High-Precision Qualitative Analysis Measurement of completely new samples is simple, even if both High-precision qualitative analysis elements and concentrations are not known.
Qualitative results are highly reliable thanks to the automatic wavelength selection system With the ICPE, the qualitative database can be calibrated quickly and fast calibration of the all-element qualitative database. Further, the use of an automatic wavelength selection system ensures accurate qualitative results are obtained with negligible impact from spectral Highly reliable qualitative results, even from actual samples interference.
No need for time-consuming comparative examination with a standard sample. With the ICPE, accurate values are shown due to wavelengths being unaffected by spectral interference from iron in the soil. With sequential-type units, remeasurement is required, and measurement conditions must be checked a number of times prior to measurement. However, with the ICPE, these measurements can all be done simply.
Method Development Assistant automatically generates measurement conditions Easily Set Accurate Conditions Method Development Assistant automatically creates measurement conditions The Method Development Assistant generates measurement conditions based on the results of the all-element qualitative analysis.
If elements Method Development Assistant are selected from the qualitative results listed, the optimal measurement Automatically creates Measurement Wavelength and Calibration Curve Information.
Correction Information is also automatically created. If interference cannot be avoided, correction information including BG Correction and IEC is also automatically generated. Simple and accurate setting of conditions Simple Element and Wavelength Selection Using the Method Development Assistant Statistical values are shown for each elemental concentration from the all-element qualitative results for the measurement sample. Selection of quantitative elements from the all-element concentration chart Automatic Generation of Measurement Wavelengths and Calibration Samples The optimal measurement wavelength is automatically selected from the quantitative element concentration range.
The Assistant also automatically generates the calibration sample. Automatically creates calibration sample information Automatically Creates Interference Correction Information The necessity of BG correction and IEC is evaluated from the quantitative element concentrations and the concentration of interference elements. However, when there are a large number of coexistent elements in addition to the elements to be measured, a variety of interference occurs.
Typical wavelengths can no longer be used and wavelength examination is required. Furthermore, when concentrations are high and the amount of Equipped with an automatic wavelength selection system Simplified Wavelength Selection Multiple displays of measurement results With conventional instruments, Conventional Echelle instrument measurement measurement of multiple types of samples under a single Element and Wavelength Sample A Sample B measurement condition 1.
Cd nm 5. Cd nm Units: ppm Typically, Multiple results with different values are the measurement method involves displayed since the presence of interference cannot be determined. Depending on the device, selecting multiple wavelengths. Cd nm — 7. All Measurement results are automatically evaluated, and unnecessary data is not displayed.
Anyone elements included in the can accurately measure samples. The optimal wavelength for measurement is automatically selected, thereby obtaining accurate measurement results. Interference elements and interference amounts for all measurement wavelengths are stored in a database. This means that interference elements and their interference amounts can be evaluated using only measurement sample data. As a result, optimal wavelengths having no interference can be accurately and automatically selected.
Accurate evaluation of interference quantities interference is excessive, a high-resolution sequential-type device is required for accurate measurement. With the ICPE, combining an automatic wavelength selection system with the IEC ensures accurate measurement is simple, even for samples requiring wavelength examination and even for samples with many matrix components that require a high-resolution sequential type unit.
Method Diagnosis Assistant checks the causes of errors Confirmation of Measurement Results is Easy With ICP emission spectrometers, measurement errors can have a number of causes, including physical interference, ionization interference and spectral interference. For this reason, a determination of whether or not the measurement results are truly the correct values is sometimes required. The solution method is displayed so that the optimal method is used, based on the results of the diagnosis, allowing simple adjustment of the method.
Method diagnosis results Solution method Diagnosis Assistant checks error causes Method Diagnosis Assistant Diagnosis of error causes for each measurement sample Error correction solutions are displayed and method is easily modified Select the correction information Accurate measurement results with minimal errors Methods are evaluated for each element and each sample.
If there are differences from the analysis values, the problem point is indicated. Calibration information is added to the method simply by selecting the solution method in the sequence shown. Method is automatically modified. The Method Diagnosis Assistant automatically generates IEC information High-precision Measurement is Simple with IEC For samples with multiple matrix components, spectral interference occurs at all wavelengths, and accurate analysis may not be possible. For this type of sample, a high-resolution sequential-type analyzer has been the logical choice.
In general, IEC requires specialized knowledge for creating calibration curve samples and for calculating correction factors. However, with the ICPE, only a single sample is required in order to add a calibration sample to the calibration curve sample.
Further, if the Method Diagnosis Assistant is used, both correction information and calibration sample data are automatically created, allowing the simple implementation of IEC.
ICPE-9000 Multitype ICP Emission Spectrometer
Secure We only pass your details on to trusted suppliers at your request. The IPCE utilizes a vacuum spectrometer that is equipped with semiconductor detectors, the first of its kind in ICP emission spectrometers. Why request a quote through SelectScience? University of Texas-Arlington Ease of use 4 out of 5 After sales service 4 out of 5 Value for money 4 out of 5 Determining the need to easily access raw data will influence purchase decision. Software wizards monitor possible interferences and suggest optimum wavelengths based upon matrix and other analytes icle.
ICPE 9000 PDF
They feature high ppb level detection ability, broad digit analysis concentration ranges, and batch analysis of multiple elements. Recent wider usage has resulted in an increased demand for shorter analysis times and improved high-matrix sample detection. As a result, we have developed two models - a "multitype" using a semiconductor detector to shorten analysis times, and a high-resolution sequential type for improved detection. The Assistant Function automatically carries out wavelength selection for measured elements and interference correction for coexisting elements, tasks that typically relied on the skill of the analyst. Simple and accurate measurement is possible even with hard-to-measure high-matrix samples. Echelle spectrometer and CCD detectors High Throughput A large-scale 1-inch CCD detector with a large number of elements has been adopted, together with an Echelle spectrometer, providing high-speed measurement.
ICPE-9000 Multitype ICP